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ARPN Journal of Science and Technology >> Volume 7, Issue 1, January 2017

ARPN Journal of Science and Technology

Behavioural Models for Analog to Digital Conversion Multi-steps Architectures

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Author A. El-Rachini, H. Chible, G.Nicola, M. Barbaro, L. Raffo
ISSN 2225-7217
On Pages 447-454
Volume No. 4
Issue No. 8
Issue Date September 01, 2014
Publishing Date September 01, 2014
Keywords A/D converters, CRZ architecture, RSD architecture,Matlab simulation.


Multi-stage analog-to-digital converters are the dominant choice in applications that require both high speed and high accuracy, such as video and wideband radio [1]. Non-idealities such as static device mismatch and dynamic timing mismatch, in different architectures of multi-steps analog to digital converter affect the redundancy and performance at the output of an instrument. Redundant sign digit (RSD) is an approach of calibration have been proposed to detect and automation no anymore only for cyclic converter but also for multistage A/D with M-bits per cycle for correction of errors in order to improve the resolution and the redundancy of A/D converters and to adapt the high performance of digital signal processing system. In this paper we will presented a behavioral model in order to investigate the impact of different sources of error at different levels of simulation based at the comparison of RSD to conventional converter with Z extra decision level (CRZ). As result, the RSD converter show a performance equivalent to CRZ with Z=2M -1 where M is the number of bits per cycle.

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