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ARPN Journal of Science and Technology >> Volume 7, Issue 2, November 2017

ARPN Journal of Science and Technology

Development of Microcontroller Base Automatic Level of Discomfort Index Measurement using Thom Model

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Author Ewetumo, Theophilus
ISSN 2225-7217
On Pages 158-165
Volume No. 2
Issue No. 3
Issue Date May 01, 2012
Publishing Date May 01, 2012
Keywords discomfort level, dry and wet thermometer, embedded system, microcontroller


Many of scientific researchers used data collected from meteorology to compute for the level of discomfort index for prediction but no attempt by scientist in third world nations, Nigeria inclusive to measure level of discomfort index directly. In this paper attempt was made to measure level of discomfort index using Thom model directly. In this model, dry and wet temperatures are required. The dry and wet thermometer was designed using microcontroller and Thom model equation was embedded inside the microcontroller. The system uses dry and wet temperature developed using semiconductor temperature sensors (LM35) for computing discomfort level of the room or/and hall in question. Other material require in the system are multiplexer (CD4052), analog to digital converter (ADC0804), microcontroller (AT80S52) and intelligent display unit (Hitachi's LCD HD44780). An assembly language was written to take in data and compute for the Thom model. The temperature measurement using LM35 for dry and wet was completely in agreement with convention built using mercury in glass thermometer in Steven Screen in The Federal University of technology, Akure meteorological garden. Also, the output of the discomfort level index was in agreement with computed data for each set of measurement by equipment.

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2012 ARPN Publishers